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Mechanical Characteristics
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Parameter
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Value
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Mechanical Shock
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MIL-STD-883C 2002.3 Test A
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Mechanical Vibration
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MIL-STD-883C 2007.1 Test A
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Solderability
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MIL-STD-883C 2003.5
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Gross Leak Test
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MIL-STD-883C 1014.7
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Fine Leak Test
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MIL-STD-883C 1014.7
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Storage Temperature
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-55°C to 125°C
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Oscillator Aging
Quartz-based oscillators exhibit a change in output frequency with time. Two dominant
mechanisms for this phenomena are change in the stresses on the quartz resonator
and mass-loading of the quartz resonator.
Changes in output frequency due to stress are a result of relaxation in the mounting
stresses of the quartz resonator or transmittal of environmental stresses through the
mounting arrangement. The R-Type oscillator contains a state-of-the-art miniature
rectangular AT-Cut resonator, rather than the arrangement that has very little stress
relaxation and isolates the quartz resonator from external stresses.
Mass-loading of the quartz resonator, which generally drives the frequency lower, is a
result of outgassing of materials within a package or a lack of package hermeticity.
Higher frequency resonators are more susceptible to this aging mechanism. The R-Type
oscillator contains a minimum number of parts internal to the package, a monolithic IC
and a quartz resonator, resulting in an internal environment that is well controlled and
characterized.
Isothermal aging studies on the R-Type oscillator performed at elevated temperatures have
shown a small frequency change due to mass-loading. With an application of 40° and
under normal conditions, the oscillator aging is typically 2 ppm the first year, 1 ppm for
the second year, and continues to logarithmically decline every ear thereafter.
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